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Verőné Wojtaszek, Małgorzata
Petőné Csuka, Ildikó
2025-12-04T12:47:51Z
2025-12-04T12:47:51Z
2025
http://hdl.handle.net/20.500.14044/36347
This Precision agriculture has become an essential approach to modern farming, aiming to optimize resource use, improve crop productivity, and ensure sustainability. A cornerstone of precision agriculture is the ability to collect, analyze, and interpret spatial and temporal information about agricultural fields. Remote sensing (RS) provides cost-effective, large-scale, and repetitive observations of crop conditions, while recent advances in artificial intelligence, especially deep learning (DL), have significantly improved the accuracy of image classification and interpretation. Integrating RS with DL techniques has therefore become a key driver of innovation in agricultural monitoring and decision support. The aim of this study is to demonstrate how satellite data can be used to detect and map heterogeneity within fields and differences in crop growth, with particular emphasis on the application of advanced classification methods. In this study, I analyzed the spatial variability of intensively cultivated agricultural fields using several machine learning and deep learning-based algorithms (Cluster, k-means, SVM, k-NN). The results of the different classification methods were compared to identify the most effective approach for assessing crop development anomalies and supporting precision agriculture.hu_HU
dc.formatPDFhu_HU
enhu_HU
Remote Sensing and Deep Learning-Based Image Classification for Precision Agriculturehu_HU
Open accesshu_HU
Óbudai Egyetemhu_HU
2025. November 13.hu_HU
Budapesthu_HU
Alba Regia Műszaki Karhu_HU
Óbudai Egyetemhu_HU
Társadalomtudományok - multidiszciplináris társadalomtudományokhu_HU
remote sensinghu_HU
sentinel2hu_HU
deep learninghu_HU
image classificationhu_HU
agriculturehu_HU
Konferenciaközleményhu_HU
PROCEEDINGS of 20th International Symposium on Applied Informatics and Related Areashu_HU
local.tempfieldCollectionsKönyvrészletekhu_HU
10.12700/AIS.2025.011
11.hu_HU
Kiadói változathu_HU
5 p.hu_HU
AIS 2025 20th International Symposium on Applied Informatics and Related Areashu_HU
978-963-449-405-8hu_HU
Óbudai Egyetemhu_HU
Budapesthu_HU


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