Supervision of the operation of digital circuits by Embedded Microcontroller

Abstract

There are many electronic circuitry applications that can be used to determine circuit behaviour and operation only with the probability of time. For certain applications (medical electronics, safety engineering, operational-critical industrial applications, transport ... etc.) it is important that the quality of the circuit can be determined. In our present article, we describe a method in which we compared the digitally produced model of a circuit, and the circuit function can be determined in relation to thattime invariant model. For this process, an embedded microcontroller environment is formed which has one of the embodied test states for combinational and sequential digital circuits.